Exploração dos Vetores Críticos à Radiação na Síntese de Circuitos Combinacionais Aproximados

Abstract

The transistor scaling, while increasing the density and performance of circuits, also raises their vulnerability to failures, necessitating effective methods to estimate and enhance their reliability. Given the complexity and limitations of existing reliability estimation methods, this work proposes the use of approximate logic synthesis as a strategy to increase circuit resilience, allowing for a certain degree of imprecision that can optimize both area and reliability without significant compromises in failure rates. The aim is to directly correlate reliability with the application of approximate synthesis through critical vectors. This approach is innovative because it blends approximation features at two levels, through the identification of minterms that optimize the quantity of cubes and literals and reliability parameters, which are obtained in multilevel struc tures. The results demonstrate that by approximating critical vectors, the approximate circuit version becomes less complex, reflecting in the total area and reliability. When comparing the results with the State of the Art, it was possible to observe that the methodology is viable for the creation of approximate versions.